The X-ray fluorescence experiment

Expose. Emit.
Measure.

Every element leaves its own fluorescent signature.

The X-ray fluorescence (XRF) experiment begins with exposing a sample to high-energy photons from an X-ray tube, which induces transitions of electrons between atomic orbitals and results in the emission of fluorescent photons.

Precision + Range

One tube.
Oxygen through uranium.

A 200 W palladium-anode X-ray tube runs at 50 kV, 4 mA, exciting elements from oxygen through uranium. A programmable beam filter (Zr standard, Al optional) and a three-position crystal changer (LiF(200) and PET standard, RX25 and Ge optional) feed a flow proportional counter and scintillation counter, covering samples up to 44 mm in diameter and 33 mm tall on a 12-position auto-sampler with a 30 rpm sample spinner.

Measurement quality

Precision depends on
two primary metrics.

1. 01

   Measurement Quality

   Usually judged as precision (repeatability), and a function of many factors.

2. 02

   Elemental Peak Resolution

   One of the two primary metrics.

3. 03

   Photon Counting Rate

   One of the two primary metrics.

Next generation silicon detector technology

Improved peak resolution.
Superior precision.

A detector upgrade built for the measurements that punish ordinary EDXRF.

Employing the next generation silicon detector technology, the enhanced NEX QC+ affords significant improvement in elemental peak resolution and counting statistics, resulting in superior calibrations and measurement precision for the most challenging measurements.

Sample handling

One chamber.
Many sample types.

A large 190 × 165 × 60 mm sample chamber accepts single-position 32 mm and 40 mm apertures, a bulk sample aperture, and optional automatic sample changers, with analysis in air or helium. The icon-driven software handles qualitative and quantitative analysis, normalization and validation, fundamental parameters, and LIMS-compatible data export, with a flow-bar wizard for building new applications.

Description highlights

For demanding applications.
For challenging measurements.

1. 01

   Critical Priorities

   Analysis time or sample throughput.

2. 02

   Detector Technology

   Next generation silicon detector technology.

3. 03

   Measurement Performance

   Superior calibrations and measurement precision.

Integrated operation

Full functionality.
No external devices.

An integrated computer and thermal printer, with Ethernet already built in.

An integrated computer and thermal printer provide full functionality without external devices, while built-in Ethernet allows seamless networking to LIMS or other control systems. Options for the Rigaku EDXRF X-ray fluorescence analyzer include a fundamental parameter software module for reducing the number of required calibration standards, an automatic sample changer, sample spinner, and helium purge for enhanced light element sensitivity.

Sample handling

One chamber.
Many sample types.

A large 190 × 165 × 60 mm sample chamber accepts single-position 32 mm and 40 mm apertures, a bulk sample aperture, and optional automatic sample changers, with analysis in air or helium. The icon-driven software handles qualitative and quantitative analysis, normalization and validation, fundamental parameters, and LIMS-compatible data export, with a flow-bar wizard for building new applications.

Key specifications

High sensitivity.
Precise elemental analysis.

1. 01

   Test Method Compliance

   ASTM D4294, IP 336, IP 496, ISO 8754, ISO 20847, JIS K2541.

2. 02

   Excitation

   50 kV X-ray tube, 4 W max power, 6 tube filter positions with shutter.

3. 03

   Detection

   High performance semiconductor detector, Peltier thermo-electric cooling, optimum balance of spectral resolution and count rate.

Background correction

Measure the sulfur peak.
Correct the background.

A better net peak intensity measurement, from a single design decision.

The sulfur analyzer’s ability to measure and correct for changes in background intensity delivers superior calibrations and enhanced real-world precision.

Precision + Range

Fixed optics.
Switchable focus.

A 40 kV chromium-anode X-ray tube excites the sample at up to 40 W, read by a doubly curved RX-9 analyzing crystal and sealed proportional counter. Fixed optics with a switchable receiving slit select between peak and background, with samples analyzed in air while the optics themselves run under vacuum from an external pump. The analyzer uses a single measurement position with a standard 35 mm cup, keeping running and consumable costs low.

Description highlights

Superior calibrations.
Enhanced real-world precision.

1. 01

   Measurement Design

   Measures both the sulfur peak and the background intensity.

2. 02

   Lower Limit of Detection

   0.3 ppm S.

3. 03

   Methods

   ASTM 2622-10, ISO 20884, and JIS K2541-7.